The electron microscope Zeiss Supra 55 VP is an extraordinarily versatile instrument used to characterize the structure and composition of materials on the nanometer scale. The four available detectors (three of which are sensitive to secondary electrons, and one sensitive to back-scattered electrons) can be partly used under vacuum and partly in a low-pressure mode. The electron microscope is additionally equipped with three additional detectors built by Oxford Instruments. The EDX and the WDX detectors allow a precise element analysis of the samples. The electron microscope features a high current mode so that the sample current is adequate for the WDX measurements. An EBSD detector, which allows the examination of the crystallographic orientation of the samples, is also built into the microscope.