The WITec 300A is a high-resolution combined atomic force microscope / Raman system for the non-destructive characterization of nanostructures. The confocal Raman system allows for spectroscopic measurements of molecules and solids with high spectral and lateral resolution while the integrated atomic force module (AFM) can be used for the topographic characterization of surfaces with nano-scale precision. Using the combination of both techniques, the WITec alpha 300A can also perform correlated measurements of AFM and Raman and is an all-purpose microscope for nanoanalytics.