Staff

Maximilian Prinz, BSc MSc

T: +43-1-4277-73816

maximilian.prinz@univie.ac.at

Perner, L. W., Truong, G-W., Follman, D., Prinz, M., Winkler, G., Puchegger, S., Cole, G. D., & Heckl, O. H. (2023). Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs. Physical Review Research, 5(3), [033048]. https://doi.org/10.1103/PhysRevResearch.5.033048

Perner, L. W., Truong, G-W., Follman, D., Prinz, M., Winkler, G., Puchegger, S., Cole, G. D., & Heckl, O. H. (2023). High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures. In 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) IEEE. https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10232458

Prinz, M., Perner, L. W., Heckl, O. H., Truong, G-W., Cole, G. D., Bober, M., Charczun, D., Morzyński, P., Narożnik, M., & Masłowski, P. (2023). High-Precision Measurement of Birefringent Mode Splitting in an Ultrastable High-Finesse Optical Cavity with Crystalline Mirrors. In 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) [CE-3.2] IEEE. https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10231509

Perner, L. W., Truong, G-W., Follman, D., Prinz, M., Winkler, G., Puchegger, S., Cole, G. D., & Heckl, O. H. (2023). High-Accuracy Measurement of Mid-IR Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures. In CLEO 2023, Technical Digest Series [SM4H.4] Optica Publishing Group. https://doi.org/10.1364/CLEO_SI.2023.SM4H.4

Perner, L. W., Winkler, G., Truong, G-W., Follman, D., Fellinger, J., Prinz, M., Puchegger, S., Cole, G. D., & Heckl, O. H. (2022). High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers. In R. Sargent, & A. Sytchkova (Eds.), Optical Interference Coatings Conference (OIC) 2022: Vancouver, British Columbia Canada 19–24 June 2022 [WA.5] Optica Publishing Group. https://doi.org/10.1364/OIC.2022.WA.5

Perner, L. W., Winkler, G., Truong, G-W., Follman, D., Fellinger, J., Prinz, M., Puchegger, S., Cole, G. D., & Heckl, O. H. (2022). High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers. Cavity Enhanced Spectroscopy 2022, Lecco, Italy.

Perner, L. W., Truong, G-W., Winkler, G., Zhao, G., Follman, D., Bailey, D. M., Nguyen, C., Prinz, M., Fleisher, A. J., Cole, G. D., & Heckl, O. H. (2022). Progress towards a 100 000 finesse optical cavity in the mid-infrared. 130-130. FLAIR 2022 - Field Laser Applications in Industry and Research 2022, Aix-les-Bains, France.

High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

Lukas W. Perner (Speaker), Gar-Wing Truong (Contributor), David Follman (Contributor), Maximilian Prinz (Contributor), Georg Winkler (Contributor), Stephan Puchegger (Contributor), Garrett D. Cole (Contributor) & Oliver H. Heckl (Contributor)

29 Jun 2023

Activity: Talks and presentations › Talk or oral contribution › Science to Science

High-Precision Measurement of Birefringent Mode Splitting in an Ultrastable High-Finesse Optical Cavity with Crystalline Mirrors

Maximilian Prinz (Speaker), Marcin Bober (Contributor), Dominik Charczun (Contributor), Lukas Perner (Contributor), Piotr Morzyński (Contributor), Mateusz Narożnik (Contributor), Gar-Wing Truong (Contributor), Garrett D. Cole (Contributor), Oliver H. Heckl (Contributor) & Piotr Masłowski (Contributor)

26 Jun 2023

Activity: Talks and presentations › Talk or oral contribution › Science to Science

High-Accuracy Measurement of Mid-IR Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

Lukas Perner (Contributor), Gar-Wing Truong (Contributor), David Follman (Contributor), Maximilian Prinz (Contributor), Georg Winkler (Contributor), Stephan Puchegger (Contributor), Garrett D. Cole (Contributor) & Oliver H. Heckl (Speaker)

8 May 2023

Activity: Talks and presentations › Talk or oral contribution › Science to Science

High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers

Lukas W. Perner (Speaker), Georg Winkler (Contributor), Gar-Wing Truong (Contributor), David Follman (Contributor), Jakob Fellinger (Contributor), Maximilian Prinz (Contributor), Stephan Puchegger (Contributor), Garrett D. Cole (Contributor) & Oliver H. Heckl (Contributor)

22 Jun 2022

Activity: Talks and presentations › Talk or oral contribution › Science to Science

Faculty Center for Nano Structure Research

Währinger Straße 38-42
1090 Wien
Room: 35504

T: +43-1-4277-73816

maximilian.prinz@univie.ac.at