Staff
Group Delay Dispersion Measurements of Novel Mid-Infrared Mirrors
Galander, U. (Speaker), Prinz, M. (Contributor), Perner, L. (Contributor) & Heckl, O. H. (Contributor)
Activity: Talks and presentations › Talk or oral contribution › Science to Science
Crystalline Supermirrors for the Mid-Infrared: Advancements and Material Metrology
Perner, L. (Contributor), Truong, G.-W. (Contributor), Prinz, M. (Contributor), Bailey, D. M. (Contributor), Winkler, G. (Contributor), Cataño-Lopez, S. B. (Contributor), Wittwer, V. (Contributor), Südmeyer, T. (Contributor), Nguyen, C. (Contributor), Puchegger, S. (Contributor), Fleisher, A. J. (Contributor), Cole, G. D. (Contributor) & Heckl, O. H. (Invited speaker)
Activity: Talks and presentations › Talk or oral contribution › Science to Science
High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures
Perner, L. W. (Speaker), Truong, G.-W. (Contributor), Follman, D. (Contributor), Prinz, M. (Contributor), Winkler, G. (Contributor), Puchegger, S. (Contributor), Cole, G. D. (Contributor) & Heckl, O. H. (Contributor)
Activity: Talks and presentations › Talk or oral contribution › Science to Science
High-Precision Measurement of Birefringent Mode Splitting in an Ultrastable High-Finesse Optical Cavity with Crystalline Mirrors
Prinz, M. (Speaker), Bober, M. (Contributor), Charczun, D. (Contributor), Perner, L. (Contributor), Morzyński, P. (Contributor), Narożnik, M. (Contributor), Truong, G.-W. (Contributor), Cole, G. D. (Contributor), Heckl, O. H. (Contributor) & Masłowski, P. (Contributor)
Activity: Talks and presentations › Talk or oral contribution › Science to Science
High-Accuracy Measurement of Mid-IR Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures
Perner, L. (Contributor), Truong, G.-W. (Contributor), Follman, D. (Contributor), Prinz, M. (Contributor), Winkler, G. (Contributor), Puchegger, S. (Contributor), Cole, G. D. (Contributor) & Heckl, O. H. (Speaker)
Activity: Talks and presentations › Talk or oral contribution › Science to Science
High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers
Perner, L. W. (Speaker), Winkler, G. (Contributor), Truong, G.-W. (Contributor), Follman, D. (Contributor), Fellinger, J. (Contributor), Prinz, M. (Contributor), Puchegger, S. (Contributor), Cole, G. D. (Contributor) & Heckl, O. H. (Contributor)
Activity: Talks and presentations › Talk or oral contribution › Science to Science
Faculty Center for Nano Structure Research
Währinger Straße 38-42
1090 Wien
Room: 35504
T: +43-1-4277-73816
