Publications
High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers
- Author(s)
- Lukas W. Perner, Georg Winkler, Gar-Wing Truong, David Follman, Jakob Fellinger, Maximilian Prinz, Stephan Puchegger, Garrett D. Cole, Oliver H. Heckl
- Abstract
We report a method to measure the refractive index of two or more materials in as-deposited thin-film structures by analysis of FTIR transmittance spectra and extraction of layer thicknesses via SEM, yielding excellent results for a GaAs/AlGaAs DBR.
- Organisation(s)
- Faculty Center for Nano Structure Research
- External organisation(s)
- Thorlabs Inc.
- No. of pages
- 3
- DOI
- https://doi.org/10.1364/OIC.2022.WA.5
- Publication date
- 2022
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103021 Optics, 205002 Coating technology, 103040 Photonics, 104026 Spectroscopy
- Keywords
- ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films
- Portal url
- https://ucrisportal.univie.ac.at/en/publications/7d401012-4c75-4b7d-820c-b11e9eb5be7f