We are delighted to announce the acquisition of the following equipment:

Sentech Spectroscopic Ellipsometer

The SENPro Spectroscopic Ellipsometer by SENTECH allows the measurement and surface mapping
of the complex refractive index and thickness of thin films for wavelengths between 370nm and 1050 nm.

Zeiss Axio Imager 2

The Zeiss Axio Imager 2 is a powerful, fully motorised microscope equipped for several different reflective light techniques.
One major highlight is its motorised stage, which allows to take large-area images as well as record images with an extended depth of focus.

Both devices complement our service portfolio and are already fully operational.
To use the equipment and get access to the corresponding laboratories, please contact Stephan Puchegger via email.